Olympus Epoch XT NDT Flaw Detector

Product Description

Olympus EPOCH XT Ultrasonic Flaw Detector

The Panametrics-NDT EPOCH XT Ultrasonic Flaw Detector is made to be used in harsh conditions and to provide a high degree of examination flexibility. In a small package with an IP67-compliant sealed shell, it incorporates a wide range of improved defect detection and measuring capabilities, a vivid multi-color LCD, flexible battery options, robust data management, and other software features.

In addition to a tunable square wave pulser, the EPOCH XT has selectable narrow-band and broad-band digital filters, a gain range of 0 to 110 dB, peak memory and peak hold, an adjustable PRF, a 0.001 in. (0.01 mm) measurement resolution, and two gates with programmable alarms.

AWS D1.1 & D1.5, Curved Surface Correction, On-board DGS/AVG, Dynamic DAC/TVG (Distance Amplitude Correction/Time Varied Gain), and GageView Pro are just a few of the standard and optional application-specific software capabilities that the unit provides.

EPOCH XT Specifications:

General

• Weight: 4.7lbs (2.1kg) with Li Battery
• Dimensions: 10.9” H x 5.9” W x 2” D (at hand), 2.8” (at display); 277 mm x 150 mm x 51 mm (at hand), 71 mm (at display)
• Keypad: English, International, Japanese or Chinese
• Languages: English, Spanish, French, German, Italian, Japanese, Chinese, Russian, Korean, Norwegian, Swedish. Custom languages available.

Gates

• Two Fully Independent Gates for Echo Height and Time-Of-Flight.
• Gate Start: Variable over entire displayed range
• Gate Width: Variable from Gate Start to end of displayed range
• Gate Height: Variable from 2 to 95% Full Screen Height
• Alarms: Positive and Negative Thresholds; Minimum Depth on Gate 1 and Gate 2
• Zoom: Displayed Range is Gate 1 Width